Examination Circular for III & IV Year Students 2025 - 2026 Examination Circular for I & II Year Students 2025 - 2026
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Design,Test,Digital,IC's,Embedded,Core,Systems,Information Science (Topical Term)

Preferred form: Design,Test,Digital,IC's,Embedded,Core,Systems,Information Science

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Work cat.: (AIT)6108: Alfred Crouch L. 10722, Design for Test for Digital IC's and Embedded Core Systems